SOLD OUT - More on the way

LCR-P1 Multi-function component Tester
FNIRSI
122-310
kg
    Delivery time:1-5 Days
Add to cart
  • Description
  • More

Electronic Component Tester

The LCR-P1 Transistor Tester is a high-precision, multifunctional electronic testing device designed specifically for electronic engineers, technicians, and enthusiasts.This device is intended for detecting and analyzing the performance and characteristics of semiconductor components such as transistors, diodes, triodes, and field-effect transistors (FETs).Equipped with a color screen, it allows for multi-parameter measurement of various components, automatically identifies the type and pin arrangement of the tested component, simplifying the operation process and enhancing testing efficiency.


Key Features

         

  • Intelligent anti-burning design: Uncharged capacitors automatically discharge upon insertion, with a user-friendly protection mechanism to prevent damage.
  • Alternate Measuring Modes: Innovatively incorporates replaceable test boards, easily tackling diverse test needs for unprecedented convenience and efficiency.
  • Intelligent Recognition Components：Simply Plug & Clamp, One-Button Quick Identification of Component Parameters, Saving Time and Effort.
  • Zener diode independent measurement: Independent measurement channel for measure diodes, measuring 0.01-32V with pre-measurement power supply for precise results.

Applications

  • Hobbyists & repairers appreciate automatic detection and color screen for quick diagnostics.

  • Technicians/engineers benefit from wide parameter range, data export, and IR decoding.

  • Safety‑minded users enjoy anti‑burn protection and accurate Zener mode.

Versatile Tester: FNIRSI LCR-P1 measures transistors, capacitors, resistors, inductors, diodes, MOSFETs, and batteries.

✦ User-Friendly Design: Features a replaceable patch seat, 1.44-inch color screen, 300mAh battery, and Type-C charging/data port.

✦ Anti-Burn Protection: Automatically discharges undischarged capacitors to prevent accidental damage.

✦ Infrared Analysis: Supports NEC infrared protocol analysis for remote control debugging and maintenance.

✦ Smart Identification: Automatically detects component pins, parameters, and specifications for faster work efficiency.


      

Supported Components & Ranges

  • Resistance: 0.01 Ω – 50 MΩ

  • Capacitance: 25 pF – 100 mF

  • Inductance: 10 µH – 1000 µH

  • Transistors:

    • BJT (NPN/PNP): hFE 10 – 600, Vb, Ie

    • MOSFETs & IGBTs: Vt, Cgs, Rds, Vf

    • JFETs: Idss, Id, Vg

  • Diodes:

    • Standard diode forward voltage < 4.5 V

    • Zener diodes: voltage range 0.01 – 32 V

  • Thyristors/Triacs: Gate turn‑on voltage < 5 V, gate current < 6 mA

  • Battery Testing: 0.1 – 4.5 V

  • Infrared Remote Decoder: NEC protocol IR decoding

⚙️ Key Features

1. Smart Auto‑Detection & Display

Place a component in the ZIF socket or test clips, press "Test," and it auto‑identifies component type and pins, displaying parameters and a schematic symbol 

2. Anti‑Burn Safety Protection

When testing capacitors, the unit automatically discharges residual voltage upon insertion to protect both the device and user, unlike many other testers.

3. SMD & THT Testing

Includes a removable ZIF socket and an SMD test pad, plus three hook‑type probes, supporting both through‑hole and surface‑mount components.

4. Zener‑Diode Mode

A dedicated Zener button lets you measure regulation voltage (0.01–32 V) using pre‑applied supply voltage for accuracy.

5. Infrared Code Analysis

Switch to IR mode to capture NEC‑coded signals from remotes—displaying address, user and waveform codes.    

🔌 Physical & Environmental Specs

Specification Details
Dimensions 130 × 85 × 45 mm (approx.)
Weight ~112 g
Display 1.44″ TFT colour
Battery 300 mAh Li‑ion, USB‑C (5 V/1 A)
Operating Temp. 0 – 40 °C
Firmware Upgrades Supported via USB